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SUMMARY:EI2025 Short Course: Information metrics for optimizing Machine Vision systems
DESCRIPTION:Description: A new set of metrics based on information theory promises to be superior to traditional MTF (SFR or sharpness) and noise for predicting machine vision system performance. We will introduce the new information metrics\, which include Noise Equivalent Quanta (NEQ)\, camera information capacity\, Ideal Observer SNR (SNRi – for the quality of object detection)\, and Edge location standard deviation (Edge σ – for the quality of edge location). We will cover the background of the new measurements\, why they are more directly related to object and edge detection than traditional measurements\, how to conveniently obtain them (primarily from standard slanted edge test patterns)\, how to interpret them\, and how to design matched filters for optimum system performance. \nLevel: Intermediate \nLength: 2 hours \nInstructor: Norman Koren\, founder & CTO Imatest LLC \nPrerequisites: Knowledge of basic image quality measurement concepts\, especially MTF (SFR) and noise \nBenefits: \n\nthe history and mathematics of information theory in imaging\,\ndefinitions and interpretations of the information metrics\, which include camera information capacity\, Noise Equivalent Quanta\, Ideal Observer SNR (SNRi – a metric for the quality of object detection)\, and Edge location standard deviation (Edge σ – a metric for the quality of edge location).\nHow to conveniently obtain the information metrics\nthe effect of common types of image processing on metrics\, including uniform sharpening and lowpass filtering (for noise-reduction)\, as well as the nonuniform bilateral filtering found in most camera JPEG images\,\ndesign of matched filters to optimize SNRi and Edge σ\,\nprogress in correlating the new metrics with machine vision performance and developing ISO 23654\n\nIntended Audience: Engineers who design and analyze cameras and imaging systems for automotive\, medical\, security applications\, and more \nFormat: Lecture Primarily lecture\, but about 1/4 to 1/3 of the time will be demonstrations \nKey Words: MTF\, information capacity\, Artificial intelligence\, machine vision. \nRegistration is open – Click Here to register \nElectronic Imaging 2025\, held February 2–6 at the Hyatt Regency San Francisco Airport\, offers a vibrant platform for industry and academia to advance imaging technologies. The event features plenary talks\, keynotes\, technical sessions\, networking opportunities\, an industry exhibit\, and a short course program\, covering all aspects of electronic imaging in a dynamic and collaborative environment. \nLearn more about Electronic Imaging 2025 \nIf you have any questions\, please contact info-metrics@imatest.com.
URL:https://www.imatest.com/event/ei2025-short-course-information-metrics-for-optimizing-machine-vision-systems/
LOCATION:Hyatt Regency San Francisco Airport\, 1333 Bayshore Highway\, Burlingame\, CA\, 94010\, United States
CATEGORIES:Training Course
ATTACH;FMTTYPE=image/jpeg:https://www.imatest.com/wp-content/uploads/2024/04/Information-Metrics.jpg
ORGANIZER;CN="IS&T%3A Society for Imaging Science and Technology":MAILTO:ei@imaging.org
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