Checkerboard Test Chart

September 16, 2016
January 19, 2023

$255.00$645.00

The Checkerboard Test Chart is available on matte inkjet, photographic paper, film, and chrome-on-glass substrates. It is designed to work with the Checkerboard module. This module enhances testing of varying distances by supplying more testable regions to provide automated measurements of sharpness, lateral chromatic aberration, and distortion from images.

Learn more about the Checkerboard Module.  Please note that this module runs slower than eSFR ISO and SFRplus modules and is less tolerant to extreme amounts of defocus or blooming degradations.

Email charts@imatest.com for current lead time on black and white film charts. 

Download PDF Info Sheet

Categories: , , ,

Our product pricing and shipping rates do not include import duties, taxes or fees. The customer / recipient is responsible for these expenses.

Description

Download PDF Info SheetThe Checkerboard Test Chart is available in Visible Spectrum and Near Infrared. In Visible Spectrum, choose between matte inkjet, reflective photographic or transmissive LVT film substrates. Contrast ratios include 4:1, 10:1 and 45:1 for the inkjet and photographic charts, and additional 100:1 for film targets. All inkjet, photographic, and film options are printed with 12 vertical squares.

Chrome on Glass Checkerboard Targets are available in the “NIR and Visible” category with 10:1 contrast ratio. Choose between a 50.8mm (2″) or 101.6mm (4″) plate with square sizes: 1mm (0.04″) and 30 x 30 squares, 2mm (0.08″) and 15 x 15 squares, 4mm (0.16″) and 7 x 7 or 20 x 20 squares, and 8mm (0.31″) and 10 x 10 squares. Or choose a 25.4mm x 76.2mm (1″ x 3″) plate with three patterns, square sizes, and dimensions of 1.07mm (0.042″) and 10 x 20 squares, 0.53mm (0.021″) and 20 x 20 squares, and 0.28mm (0.01″) and 40 x 40 squares.

 

Pre-Mounted Checkerboard Charts are also available for use with Imatest Uniform Light Sources

Learn more about the Checkerboard Module.

Checkboard Test Chart Options:

Spectrum Substrate Conrast Ratio Size Square Height MP Suitability
Visible Only Reflective Matte 4:1, 10:1, 45:1 XS, SM, MD, LG (see below) 12 See table below
Visible Only Transmissive Color Film 4:1, 10:1, 100:1 8” x 10” (203mm x 254mm) 12 13 MP
Near Infrared (NIR) & Visible Photographic Reflective 4:1, 10:1, 45:1 SM, MD, LG (see below) 12 See table below
Near Infrared (NIR) & Visible Reflective Matte 4:1, 10:1, 45:1 XS, SM, MD, LG (see below) 12 See table below
Near Infrared (NIR) & Visible Transmissive B&W Film 4:1, 10:1, 100:1 304.8mm x 508mm (12″ x 20”) 12 24 MP
Near Infrared (NIR) & Visible Chrome on Glass 10:1 50.8mm (2”) plate with 1, 2, or 4mm squares 30 x 30, 15 x 15, 7 x 7 6 MP
Near Infrared (NIR) & Visible Chrome on Glass 10:1 101.6mm (4”) plate with 4 or 8mm squares 20 x 20 or 10 x 10 26 MP
Near Infrared (NIR) & Visible Chrome on Glass 10:1 25.4mm x 76.2mm (1″ x 3″) plate with three charts 10 x 20, 20 x 20, and 40 x 40  

 

Paper Size and Active Area Options for Reflective Substrates

Inkjet charts are available in four standard sizes:

  Paper Size (including margin) Active Area MP Suitability
X-Small 215.9mm x 323.85mm (8.5″ × 12.75″) 200.66mm x 300.99mm (7.9″ × 11.85″) 3.1 
Small 406.4mm x 609.6mm (16″ × 24″) 391.16mm x 586.74mm (15.4″ × 23.1″) 5.9
Medium 609.6mm x 914.4mm (24″ × 36″) 594.36 x 891.54mm (23.4″ × 35.1″) 14.3
Large 1107.4mm x 1676.4mm (43.6″ × 66″) 1102.35mm x 1653.54mm (43.4″ × 65.1″) 28.1

 

Photographic charts are available in two standard sizes:

  Paper Size (including margin) Active Area MP Suitability
Small 406.4mm x 609.6mm (16″ × 24″) 391.16mm x 586.74mm (15.4″ × 23.1″) 11.8
Medium 609.6mm x 914.4mm (24″ × 36″) 594.36mm x 891.54mm (23.4″ × 35.1″) 28.6

Documentation and software support

Checkerboard can be run either through the highly-interactive Rescharts interface or as a batch-capable fixed module. The key documentation for getting started is Using Checkerboard Part 1, found in the Checkerboard section of the Documentation page. Checkerboard provides the most accurate distortion measurements.